QUANTITATIVE MAGNETOMETRY USING ELECTRON HOLOGRAPHY - FIELD PROFILES NEAR MAGNETIC FORCE MICROSCOPE TIPS

Authors
STREBLECHENKO DG SCHEINFEIN MR MANKOS M BABCOCK K
Citation
Dg. Streblechenko et al., QUANTITATIVE MAGNETOMETRY USING ELECTRON HOLOGRAPHY - FIELD PROFILES NEAR MAGNETIC FORCE MICROSCOPE TIPS, IEEE transactions on magnetics, 32(5), 1996, pp. 4124-4129
Citations number
9
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
IEEE transactions on magnetics → ACNP
ISSN journal
00189464
Volume
32
Issue
5
Year of publication
1996
Part
1
Pages
4124 - 4129
Database
ISI
SICI code
0018-9464(1996)32:5<4124:QMUEH->2.0.ZU;2-2
Abstract
Magnetic force microscopy offers an inexpensive means of measuring mag netic microstructure with high spatial resolution by scanning a magnet ized tip across the surface of a magnetic sample. Contrast in the magn etic force microscope is a complicated function of the magnetic fields emanating both from the tip and the sample under observation. Electro n holographic methods were used in order to quantitatively determine t he fields in proximity to extremely small magnetic force microscope ti ps.