MICROSTRUCTURAL STUDIES TO PROBE TEXTURED GROWTH OF SPUTTERED STRONTIUM FERRITE THIN-FILMS

Sputtered strontium ferrite films upon annealing at higher temperature s show different textures depending on the deposition parameters as if these parameters leave their signature which eventually decides the t exture. To understand the origin of this phenomena the 'as deposited' sputtered strontium ferrite films were studied using transmission elec tron microscopy, The study showed that the 'as deposited' films were m ade up of microcrystallites which were not detected by X-ray diffracti on. The study also hinted some kind of texture in the 'as deposited' f ilms, which might be responsible for the final texture of the films wh en annealed at higher temperatures.