Measurements of the effects of annealing on symmetric Co/Cu spin valve
s and similar structures show increased coercivity, increased ferromag
netic resonance linewidth and reduced moment. Low angle x-ray reflecti
vity measurements indicate that there is some oxidation throughout the
thickness of the metal films during annealing. The layer structure, a
s determined from low-angle x-ray reflectivity and magnetoresistance v
alues is only weakly affected by annealing at 250 C. We conclude from
these results that the Cu/Co interfaces are not strongly affected, and
we suspect that the thermally induced changes in these samples includ
e partial oxidation which occurs mainly in the grain boundaries, which
lie perpendicular to the film plane.