MICROWAVE NOISE CHARACTERIZATION OF 2-PORT DEVICES USING AN UNCALIBRATED TUNER

A novel noise-parameter and S-parameter measurement system is proposed , Any device under test (DUT) can be characterized using the proposed setup. Such characterization is performed without any preset condition s on the input impedance of the noise-receiver and the repeatability o f the impedance tuning mechanism, The DUT is used as a standard for tu ner calibration, Measurements were carried out on a general purpose Ga As-MESFET, The extracted transistor noise-parameters are in good agree ment with the manufacturer's specified values over the operating frequ ency band (4-8 GHz).