Wh. Waddell et Lr. Evans, APPLICATIONS OF PROTON-INDUCED X-RAY-EMISSION SPECTROSCOPY TO TIRE MATERIAL CHARACTERIZATIONS, Kautschuk und Gummi, Kunststoffe, 49(9), 1996, pp. 571
Proton induced X-ray emission (PIXE) is a spectroscopic analysis techn
ique based on detecting the emitted radiation from an atom excited upo
n interaction with a high-energy proton. It has been used to quantitat
ively determine to ppm levels, the elements present in a variety of su
bstrates including inorganic, organic and biological samples. The tech
nique is particularly applicable to quantifying the inorganic material
s present in rubber compounds: non-black fillers (clay silica, talc),
oxides (magnesium, titanium, zinc), colbalt adhesion promoters and tot
al sulfur The non-destructive nature of the experiment and facile samp
le preparation make PIXE measurements particularly useful when only sm
all quantities of material are available. PIXE in conjunction with cha
racterization techniques that-afford structural information of specifi
c compounding ingredients, can afford precise analytical characterizat
ions of rubber compounds.