QUANTITATIVE-ANALYSIS OF THIN-FILMS OF RBA(2)CU(3)O(7-X) (R-EQUALS-RARE-EARTH-ELEMENTS) AND ZRO2 (Y2O3) BUFFER LAYERS BY SNMS

Authors
REBANE JA KAUL AR TRETYAKOV YD
Citation
Ja. Rebane et al., QUANTITATIVE-ANALYSIS OF THIN-FILMS OF RBA(2)CU(3)O(7-X) (R-EQUALS-RARE-EARTH-ELEMENTS) AND ZRO2 (Y2O3) BUFFER LAYERS BY SNMS, Fresenius' journal of analytical chemistry, 356(8), 1996, pp. 484-487
Citations number
7
Categorie Soggetti
Chemistry Analytical
Journal title
Fresenius' journal of analytical chemistry → ACNP
ISSN journal
09370633
Volume
356
Issue
8
Year of publication
1996
Pages
484 - 487
Database
ISI
SICI code
0937-0633(1996)356:8<484:QOTOR(>2.0.ZU;2-D
Abstract
It is shown that RBa(2)Cu(3)O(7-x) single crystals may be used as refe rence samples for the quantitative analysis of RBa(2)Cu(3)O(7-x) thin films by SNMS. RSF-values for Y and Cu (relative to Ba) determined for ceramic RBa(2)Cu(3)O(7-x) samples are higher than those for single cr ystals. This difference may be caused by Ba segregation on grain bound aries. The depth profile analysis of YSZ/Al2O3 samples was performed b y DBM using a Ni grid to prevent sample charging. The reproducibility of analysis tvas better than 10%.