LOW-VOLTAGE BUILT-IN CURRENT SENSOR

A low voltage built-in current sensor (BICS) for I-DDQ testing based o n the bulk-driven current mirror technique is proposed. This design ha s a small overhead in terms of area and needs only one external power supply. Different current resolution requirements can be met by adjust ing the aspect ratio of the transistors in the design. HSPICE simulati on results show that high error detection speed and small performance impact on the original circuit are also achieved.