SPUTTERED NI-YTTRIA STABILIZED ZIRCONIA COMPOSITE FILM ELECTRODES FORSOFC

Citation
K. Hayashi et al., SPUTTERED NI-YTTRIA STABILIZED ZIRCONIA COMPOSITE FILM ELECTRODES FORSOFC, Denki Kagaku Oyobi Kogyo Butsuri Kagaku, 64(10), 1996, pp. 1097-1101
Citations number
17
Categorie Soggetti
Electrochemistry
ISSN journal
03669297
Volume
64
Issue
10
Year of publication
1996
Pages
1097 - 1101
Database
ISI
SICI code
0366-9297(1996)64:10<1097:SNSZCF>2.0.ZU;2-9
Abstract
Nickel oxide and 8 mol% yttria stabilized cubic zirconia (YSZ) composi te mms were co-deposited on Al2O3 and YSZ substrates with a reactive s puttering technique in argon and oxygen atmosphere using Ni and YSZ ta rgets and reduced in a gas flow of 96%N-2-4%H-2 at 1000 degrees C for 3 h. The co-sputtering of YSZ and Ni suppressed the growth of Ni grain s and decreased the anodic overvoltage for hydrogen oxidation. The com posite anode is especially attractive as the SOFC operating at lower t emperatures, e.g., 800 degrees C.