APPLICATION OF AN ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE TO MICROMECHANICAL FABRICATION

Citation
Bk. Paul et M. Klimkiewicz, APPLICATION OF AN ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE TO MICROMECHANICAL FABRICATION, Scanning, 18(7), 1996, pp. 490-496
Citations number
20
Categorie Soggetti
Microscopy
Journal title
ISSN journal
01610457
Volume
18
Issue
7
Year of publication
1996
Pages
490 - 496
Database
ISI
SICI code
0161-0457(1996)18:7<490:AOAESE>2.0.ZU;2-F
Abstract
Current advanced methods of micromechanical fabrication require expens ive tooling or are restricted to the fabrication of lateral-shaped mic rostructures. To overcome these limitations, recent efforts have used microscale additive freeform fabrication (AEF) methods to prototype mi cromechanical structures. However, these laser-based methods are limit ed in resolution. To improve the resolution of microscale AFF methods, an environmental scanning electron microscope (ESEM) was used to prot otype several electron-beam (EB)-based microscale AFF processes. The r esults showed that the ESEM is capable of demonstrating process feasib ility for EB-based microscale AFF.