Bk. Paul et M. Klimkiewicz, APPLICATION OF AN ENVIRONMENTAL SCANNING ELECTRON-MICROSCOPE TO MICROMECHANICAL FABRICATION, Scanning, 18(7), 1996, pp. 490-496
Current advanced methods of micromechanical fabrication require expens
ive tooling or are restricted to the fabrication of lateral-shaped mic
rostructures. To overcome these limitations, recent efforts have used
microscale additive freeform fabrication (AEF) methods to prototype mi
cromechanical structures. However, these laser-based methods are limit
ed in resolution. To improve the resolution of microscale AFF methods,
an environmental scanning electron microscope (ESEM) was used to prot
otype several electron-beam (EB)-based microscale AFF processes. The r
esults showed that the ESEM is capable of demonstrating process feasib
ility for EB-based microscale AFF.