SIMULATION OF A SCANNED TIP ON A NAF(001) SURFACE IN FRICTION FORCE MICROSCOPY

The profiling process of a friction force microscope (FFM) tip scannin g a NaF (001) surface is simulated using a simple model for the FFM ba sed on the solution of the equations of motion. Complete friction forc e microscopy images as well as individual scan lines are calculated us ing a model potential for the tip-sample interaction. The nature of th e movement of the tip in the interaction potential is analysed and dem onstrates the two-dimensional character of the occurring lateral force s. Comparison with recent experimental studies shows good agreement of simulations and experimentally obtained data.