A METHOD OF MEASURING SURFACE PERMITTIVITY BY MICROWAVE DIELECTRIC ANALYSIS

Citation
S. Naito et al., A METHOD OF MEASURING SURFACE PERMITTIVITY BY MICROWAVE DIELECTRIC ANALYSIS, Review of scientific instruments, 67(10), 1996, pp. 3633-3641
Citations number
19
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
ISSN journal
00346748
Volume
67
Issue
10
Year of publication
1996
Pages
3633 - 3641
Database
ISI
SICI code
0034-6748(1996)67:10<3633:AMOMSP>2.0.ZU;2-X
Abstract
A method for controlling skin depth by microwave dielectric analysis u sing an open end cell is presented here. The correlation between the m easured permittivity, the electric length of the cell, and the permitt ivity depth profile has been shown from time domain reflectometry meas urements on a sample with known depth profile of permittivity. This sk in depth controlling method is exceedingly useful for dielectric analy sis of water in Living organisms and related food products. (C) 1996 A merican Institute of Physics.