INTERFEROMETRIC DETERMINATION OF THE ELECTRON-DENSITY IN A HIGH-PRESSURE XENON LAMP WITH A HOLOGRAPHIC OPTICAL-ELEMENT

A new setup for plasma diagnostics is presented that is based on real- time holographic interferometry. The hologram is used as a holographic optical element (HOE) that combines the properties of a hologram, of a lens, and of a grating simultaneously The ROE is responsible for the formation of the interference pattern, and, in addition, acts as an i maging element and prevents most of the plasma radiation from reaching the interferogram detection system. The spectral and imaging properti es of this HOE are calculated numerically, and this numeric procedure is tested experimentally. We applied the HOE-interferometry technique to the measurement cf the electron density in a brightly radiating hig h-pressure xenon lamp. The principle of this experiment, two-wavelengt h interferometry, is described, and the results of the measurement are presented and discussed. (C) 1996 Optical Society of America