MICROELECTROCHEMISTRY ON SURFACES WITH THE SCANNING ELECTROCHEMICAL MICROSCOPE (SECM)

Citation
D. Mandler et al., MICROELECTROCHEMISTRY ON SURFACES WITH THE SCANNING ELECTROCHEMICAL MICROSCOPE (SECM), Israel Journal of Chemistry, 36(1), 1996, pp. 73-80
Citations number
44
Categorie Soggetti
Chemistry
Journal title
ISSN journal
00212148
Volume
36
Issue
1
Year of publication
1996
Pages
73 - 80
Database
ISI
SICI code
0021-2148(1996)36:1<73:MOSWTS>2.0.ZU;2-6
Abstract
The scanning electrochemical microscope (SECM) is one of the scanning probe techniques that have been developed following the introduction o f the scanning tunneling microscope. The approaches that have been use d to modify surfaces with lateral resolution using the SECM are presen ted and discussed. These approaches made it possible to drive a variet y of microelectrochemical reactions on surfaces, as well as to study t he mechanism of these processes due to the unique advantages that the SECM offers.