Zm. Zhang et al., AN APPARATUS FOR INFRARED TRANSMITTANCE AND REFLECTANCE MEASUREMENTS AT CRYOGENIC TEMPERATURES, International journal of thermophysics, 17(6), 1996, pp. 1441-1454
A facility for measuring the optical properties of solid materials at
cryogenic temperatures is bring developed at the National Institute of
Standards and Technology. A cryostat that houses four bolometric dete
ctors and a six-position sample holder was designed and built. The bol
ometers operate near 5 K, and the sample temperature can be varied fro
m 6 to 100 K. The beam from a Fourier transform spectrometer is direct
ed to the cryostat by reflective optical components. The measurable wa
velengths extend from 1 mu m to 1 mm, with appropriate sources and bea
msplitters in the spectrometer as well as as windows and detectors in
the cryostat. Thr angle of incidence on the sample ranges from 7.5 to
60 degrees. The mechanical, electrical, and optical designs are descri
bed in this paper. Initial measurement results at wavelengths from 2 t
o 30 mu m and a sample temperature of 10 K are presented.