E. Jaroli et al., ION-BEAM CHANNELING STUDY OF COBALT IMPLANTED SAPPHIRE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 123-127
Rutherford backscattering spectrometry combined with channeling and Tr
ansmission Electron Microscopy (TEM) were used for investigation of co
balt implanted single crystalline alpha-Al2O3. The energy of the cobal
t ions was 150 keV with various doses, To get good crystalline quality
after implantation, a thermal annealing at 1500 degrees C for 1 hour
was carried out. Angular scans were performed along different axes, We
found that crystalline precipitates grew epitaxially into the hexagon
al host crystal. The presence of precipitates was also proven by cross
sectional TEM measurements that showed their typical diameter between
10-50 nm. Other than these precipitates no cobalt was found by energy
dispersive spectroscopy.