C. Neelmeijer et al., DEPTH RESOLVED ION-BEAM ANALYSIS OF OBJECTS OF ART, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 338-345
The external proton beam progressively gains more attention, particula
rly in connection with recent new possibilities combining non-vacuum P
IXE and RES. To identify paint layer arrangements and their elemental
composition external PIXE was applied varying the incident proton ener
gy. This technique is checked on a set of test paint layers combining
pigments typically applied in the Middle Ages as well as presently. Th
in surface paint has been successfully characterized by means of simul
taneous external RES complementary to PIXE, Presented as an example ar
e depth resolved measurements on a red colored detail of the painting
''14 Nothelfer'' from Lucas Cranach the Elder.