DEPTH RESOLVED ION-BEAM ANALYSIS OF OBJECTS OF ART

Citation
C. Neelmeijer et al., DEPTH RESOLVED ION-BEAM ANALYSIS OF OBJECTS OF ART, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 338-345
Citations number
24
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
ISSN journal
0168583X
Volume
118
Issue
1-4
Year of publication
1996
Pages
338 - 345
Database
ISI
SICI code
0168-583X(1996)118:1-4<338:DRIAOO>2.0.ZU;2-#
Abstract
The external proton beam progressively gains more attention, particula rly in connection with recent new possibilities combining non-vacuum P IXE and RES. To identify paint layer arrangements and their elemental composition external PIXE was applied varying the incident proton ener gy. This technique is checked on a set of test paint layers combining pigments typically applied in the Middle Ages as well as presently. Th in surface paint has been successfully characterized by means of simul taneous external RES complementary to PIXE, Presented as an example ar e depth resolved measurements on a red colored detail of the painting ''14 Nothelfer'' from Lucas Cranach the Elder.