B. Brijs et al., STOICHIOMETRIC CHANGES OF SI, COSI2 AND TISI2 DURING LOW-ENERGY OXYGEN BOMBARDMENT IN COMBINATION WITH OXYGEN BLEED-IN, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 541-546
Rutherford backscattering spectrometry was used to investigate the nea
r surface compositional changes and the internal layer variations of S
i, CoSi2 and TiSi2 during 12 keV O-2(+) bombardment with and without o
xygen bleed-in. Experiments have been carried out with the angle of in
cidence between the sputter beam and the normal at 26 and 40 degrees.
The results show the incorporation of oxygen, leading to oxide formati
on, preferential sputtering of Si in the silicides and the formation o
f a surface oxide during oxygen flooding.