Wm. Arnoldbik et al., A HIGH-RESOLUTION MAGNETIC SPECTROGRAPH FOR ION-BEAM ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 566-572
A magnetic spectrograph especially designed for interface and thin fil
m analysis has been installed at the 6.5 MV tandem accelerator of the
University of Utrecht. It is provided with a Wien filter, so that both
the mass and the charge of the ions arriving in the focal plane is de
termined. In the focal plane a two-dimensional position-sensitive dete
ctor is used to obtain spectra with resolved energy along one axis, an
d resolved angles (perpendicular to the scattering plane) along the ot
her axis, A special bellows construction allows the spectrograph to be
rotated over an angular range of 120 degrees while maintaining the ul
tra-high vacuum conditions. The first results of RBS and ERD measureme
nts are presented.