T. Kobayashi et al., SEPARATION OF SCATTERED IONS AND NEUTRALS IN MEDIUM-ENERGY ION-SCATTERING SPECTROSCOPY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 584-587
For the purpose of surface and buried interface structural analysis, w
e have developed a medium-energy (similar to 100 keV) ion scattering (
MEIS) spectrometer with a time-of-flight (TOF) energy analyzer that ca
n detect scattered ions and neutrals separately at a scattering angle
of 180 degrees. One of the reasons to use the TOF analyzer rather than
an electrostatic one is to avoid the ambiguity in the ion neutralizat
ion probability. Indeed, we have found that the neutralization probabi
lity of 100 keV He+ ions backscattered from a Si(001) sample exhibits
remarkable angular variations.