ANALYSIS OF STOICHIOMETRY OF HIGH-T-C SUPERCONDUCTING FILMS BY RBS AND PIXE METHODS

Authors
SANDRIK R JERGEL M STRBIK V NAKAMURA K ISHII A ORLIC I TANG SM WATT F
Citation
R. Sandrik et al., ANALYSIS OF STOICHIOMETRY OF HIGH-T-C SUPERCONDUCTING FILMS BY RBS AND PIXE METHODS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 602-607
Citations number
17
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
118
Issue
1-4
Year of publication
1996
Pages
602 - 607
Database
ISI
SICI code
0168-583X(1996)118:1-4<602:AOSOHS>2.0.ZU;2-3
Abstract
Lateral inhomogeneity has been studied in thin films of YBa2Cu3O7-delt a, deposited from aerosol on MgO substrates. RBS and PIXE analyses dis tinguished areas that were found to differ in the critical temperature T-c values. The PIXE results confirmed the differences in composition between those areas. Variations in layer thicknesses were found by me ans of RBS analysis. Measurements made with a microbeam showed that th e film within each of those areas was homogeneous. However, significan t variations in the Y-Ba-Cu-O stoichiometry and local changes in the f ilm thickness were found in the intermediate zone between areas with T -c = 85 K and T-c less than or equal to 80 K.