Cg. Smallman et al., 287 TRAPPING OF IMPLANTED HYDROGEN IN TYPE IA DIAMOND, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 688-692
Recent developments in the doping of diamond and in the technology of
diamond film synthesis have stimulated interest in its use as a substr
ate material for electronic devices, as well as in a range of other ne
w applications. Hydrogen is one of the most common impurities in natur
al and synthetic diamond, and is known to affect its electrical proper
ties. However, the incorporation of hydrogen in diamond is still not w
ell understood. In this paper wt report a study of the trapping of hyd
rogen introduced into a type Ia natural diamond by ion implantation. T
he hydrogen depth distribution was measured by means of nuclear resona
nt reaction analysis (NRRA) after each stage of an annealing program.
Deep trapping of implanted hydrogen within its own range distribution
was observed, in contrast to the case in silicon.