FAST POSITION-SENSITIVE DETECTION APPLIED TO TIME-OF-FLIGHT ION-SCATTERING AND RECOIL SPECTROSCOPY FOR REALTIME MONITORING OF SURFACE-COMPOSITION AND CRYSTALLOGRAPHY

Authors
SCHULTZ JA ULRICH S WOOLVERTON L BURTON W WATERS K KLEIN C WOLLNIK H
Citation
Ja. Schultz et al., FAST POSITION-SENSITIVE DETECTION APPLIED TO TIME-OF-FLIGHT ION-SCATTERING AND RECOIL SPECTROSCOPY FOR REALTIME MONITORING OF SURFACE-COMPOSITION AND CRYSTALLOGRAPHY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 758-765
Citations number
19
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
118
Issue
1-4
Year of publication
1996
Pages
758 - 765
Database
ISI
SICI code
0168-583X(1996)118:1-4<758:FPDATT>2.0.ZU;2-F
Abstract
A newly developed channel plate-based postion-sensitive ion and fast n eutral detector has been applied for the first time to time-of-flight ion scattering. Spatial resolutions of better than 0.5 mm and timing r esolutions of better than 0.5 ns are illustrated by pulsed K induced r ecoil and scattering from an hydroxylated Si(100) surface. The possibi lity to simultaneously record angle resolved spectra at data rates in excess of 10 MHz is suggested.