PROPERTIES OF A SUBMICROMETER X-RAY-BEAM AT THE EXIT OF A WAVE-GUIDE

This report discusses the properties of a 13-keV submicrometer x-ray b eam exiting from a waveguide. Waveguides for this spectral regime can be constructed by enclosing a low-absorbing material between highly ab sorbant metals. Best performance is found for about 0.1 mu m guiding l ayer thickness. Measurements of the photon beam size close to the exit and of the intensity distribution far from the exit will be presented . From these data one derives a beam size at the exit which is identic al to the guiding layer thickness. This number being in the submicrome ter range offers interesting perspectives for microscopy experiments i n the hard x-ray range. (C) 1996 American Institute of Physics.