W. Monch, EMPIRICAL TIGHT-BINDING CALCULATION OF THE BRANCH-POINT ENERGY OF THECONTINUUM OF INTERFACE-INDUCED GAP STATES, Journal of applied physics, 80(9), 1996, pp. 5076-5082
The band lineup at metal-semiconductor contacts as well as at semicond
uctor heterostructures may be described by one and the same physical c
oncept, the continuum of interface-induced gap states. These intrinsic
interface states derive from the virtual gap states (ViGS) of the com
plex semiconductor band structure and their character varies from pred
ominantly donorlike closer to the valence band to mostly acceptorlike
nearer to the conduction band. Calculations are presented of the respe
ctive branch points for elemental and binary as well as ternary compou
nd semiconductors which make use of Baldereschi's concept of mean-valu
e points in the Brillouin zone [Phys. Rev. B 7, 5212 (1973)], Penn's i
dea of dielectric band gaps [Phys. Rev. 128, 2093 (1962)], and the emp
irical tight-binding approximation (ETB). The results are as follows.
First, at the mean-value point the band gaps calculated in the GW appr
oximation have the same widths as the dielectric band gaps. Second, th
e ETB approximation reproduces the GW valence-band energies at the mea
n-value point. Third, the branch points of the ViGS are slightly below
midgap at the mean-value point. The ETB branch-point energies excelle
ntly reproduce the barrier heights of gold Schottky contacts on 19 sem
iconductors and the valence-band offsets of Al1-xGaxAs/GaAs heterostru
ctures. (C) 1996 American Institute of Physics.