CHARGE TRAPPING INDUCED ELECTROMECHANICAL ENERGY

Citation
C. Coudray et G. Blaise, CHARGE TRAPPING INDUCED ELECTROMECHANICAL ENERGY, Journal of applied physics, 80(9), 1996, pp. 5248-5255
Citations number
21
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
80
Issue
9
Year of publication
1996
Pages
5248 - 5255
Database
ISI
SICI code
0021-8979(1996)80:9<5248:CTIEE>2.0.ZU;2-Q
Abstract
The electromechanical energy stored in a dielectric subjected to the f ield of a trapped charge is calculated by a self-consistent method, us ing a point-dipole model for the polarization. The magnitude of this e nergy is 5-10 eV per trapped charge, depending on the structure (fcc o r bcc) and the location of the charge (atomic site or intersite). It i s proposed to attribute the degradation of dielectric materials to the release of this energy after the detrapping of initially trapped char ges. (C) 1996 American Institute of Physics.