ELEMENT-SPECIFIC MAGNETIZATION OF BURIED INTERFACES PROBED BY DIFFUSE-X-RAY RESONANT MAGNETIC SCATTERING

The magnetization of buried interfaces and its relationship to interfa cial roughness is probed for Co films and Co/Cu multilayers using diff use x-ray resonant magnetic scattering, a method in which the average diffusely scattered x-ray intensity is compared with the component tha t reflects magnetic scattering. The comparison demonstrates that the b oundary between magnetic and nonmagnetic layers is smoother than the i nterfacial roughness, with short-wavelength roughness less effective i n magnetic scattering than longer-wavelength roughness.