POLARIZATION PHENOMENA IN THE OPTICAL-PROPERTIES OF POROUS SILICON

Citation
F. Koch et al., POLARIZATION PHENOMENA IN THE OPTICAL-PROPERTIES OF POROUS SILICON, Journal of luminescence, 70, 1996, pp. 320-332
Citations number
28
Categorie Soggetti
Optics
Journal title
ISSN journal
00222313
Volume
70
Year of publication
1996
Pages
320 - 332
Database
ISI
SICI code
0022-2313(1996)70:<320:PPITOO>2.0.ZU;2-7
Abstract
We examine the polarization memory effect for porous Si excited by lin early polarized light. The various observations for the red-luminescin g, slow band are discussed in the general framework of particle shape asymmetry. We show that because of the intrinsically nonlinear lumines cence response, measurement parameters influence the polarization resp onse. The preparation of porous Si with photoassisted etching is found to control the polarization retention parameter rho. Using linearly p olarized light during etching produces in-plane asymmetries. We find a substantial rho-anisotropy linked to crystal symmetry planes and axes as a consequence of anisotropic etching. The effects are discussed wi th reference to current models of the light emission mechanism.