SIMULTANEOUS DETERMINATION OF THE STRAIN STRESS TENSOR AND THE UNSTRAINED LATTICE-CONSTANTS BY X-RAY-DIFFRACTION/

Authors
WIEDER T
Citation
T. Wieder, SIMULTANEOUS DETERMINATION OF THE STRAIN STRESS TENSOR AND THE UNSTRAINED LATTICE-CONSTANTS BY X-RAY-DIFFRACTION/, Applied physics letters, 69(17), 1996, pp. 2495-2497
Citations number
14
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
69
Issue
17
Year of publication
1996
Pages
2495 - 2497
Database
ISI
SICI code
0003-6951(1996)69:17<2495:SDOTSS>2.0.ZU;2-J
Abstract
The main prerequisite for residual stress evaluation by x-ray diffract ion is the knowledge of the unstrained lattice constants a(O,m) (m = 1 ,2,3). Often the a(O,m) are unknown. A method is presented which gives the stress and strain tensor together with the a(O,m) simultaneously from the same set of data. (C) 1996 American Institute of Physics.