ULTRAFAST HIGH-INTENSITY NONLINEAR ABSORPTION DYNAMICS IN LOW-TEMPERATURE-GROWN GALLIUM-ARSENIDE

Citation
U. Siegner et al., ULTRAFAST HIGH-INTENSITY NONLINEAR ABSORPTION DYNAMICS IN LOW-TEMPERATURE-GROWN GALLIUM-ARSENIDE, Applied physics letters, 69(17), 1996, pp. 2566-2568
Citations number
18
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
17
Year of publication
1996
Pages
2566 - 2568
Database
ISI
SICI code
0003-6951(1996)69:17<2566:UHNADI>2.0.ZU;2-4
Abstract
We study carrier dynamics in GaAs thin films grown by molecular beam e pitaxy at 250, 300, and 350 degrees C by differential transmission exp eriments at various carrier excitation densities. The differential tra nsmission shows that carrier trapping in point defects is much faster than the recombination of the trapped carriers. As a consequence, the defect states can be saturated at high carrier densities. if the growt h temperature is decreased, the initial trapping becomes faster while the subsequent recombination of the trapped carriers becomes slower. W e show that this is due to the growth temperature dependent defect den sities. (C) 1996 American Institute of Physics.