A novel class of low molecular-weight organic resist materials for nan
ometer lithography, 1,3,5-tris[4-(4-toluenesulfonyloxy)phenyl]benzene
(TsOTPB) and 4,4',4 ''-tris(allylsuccinimido)triphenylamine (ASITPA),
was designed and synthesized. TsOTPB with a glass-transition temperatu
re (Tg) of 64 degrees C and ASITPA with a Tg of 80 degrees C were foun
d to function as positive and negative resists, respectively, enabling
the fabrication of 150 and 70 nm line patterns on exposure to an elec
tron beam at 50 keV. (C) 1996 American Institute of Physics.