Bw. Chui et al., LOW-STIFFNESS SILICON CANTILEVERS FOR THERMAL WRITING AND PIEZORESISTIVE READBACK WITH THE ATOMIC-FORCE MICROSCOPE, Applied physics letters, 69(18), 1996, pp. 2767-2769
Low-stiffness silicon cantilevers have been developed for proposed dat
a storage devices based on the atomic force microscope, in particular
thermomechanical recording. The cantilevers combine a sharp tip with a
n integrated piezoresistive sensor for data readback from a rotating p
olycarbonate disk. A novel process was developed to make shallow piezo
resistors in cantilevers 1 mu m thick, significantly thinner and there
fore softer than previously possible. Readback was demonstrated at lin
ear velocities up to 120 mm/s. Separate cantilevers with resistively h
eated tips were fabricated for writing data marks on polycarbonate, wi
th measured thermal time constants of 30 mu s. (C) 1996 American insti
tute of Physics.