LOW-STIFFNESS SILICON CANTILEVERS FOR THERMAL WRITING AND PIEZORESISTIVE READBACK WITH THE ATOMIC-FORCE MICROSCOPE

Citation
Bw. Chui et al., LOW-STIFFNESS SILICON CANTILEVERS FOR THERMAL WRITING AND PIEZORESISTIVE READBACK WITH THE ATOMIC-FORCE MICROSCOPE, Applied physics letters, 69(18), 1996, pp. 2767-2769
Citations number
24
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
18
Year of publication
1996
Pages
2767 - 2769
Database
ISI
SICI code
0003-6951(1996)69:18<2767:LSCFTW>2.0.ZU;2-N
Abstract
Low-stiffness silicon cantilevers have been developed for proposed dat a storage devices based on the atomic force microscope, in particular thermomechanical recording. The cantilevers combine a sharp tip with a n integrated piezoresistive sensor for data readback from a rotating p olycarbonate disk. A novel process was developed to make shallow piezo resistors in cantilevers 1 mu m thick, significantly thinner and there fore softer than previously possible. Readback was demonstrated at lin ear velocities up to 120 mm/s. Separate cantilevers with resistively h eated tips were fabricated for writing data marks on polycarbonate, wi th measured thermal time constants of 30 mu s. (C) 1996 American insti tute of Physics.