APPLICATION OF PIEZORESISTIVE WHEATSTONE BRIDGE CANTILEVER IN ADVANCED ATOMIC-FORCE MICROSCOPY TECHNIQUES

The paper presents an application of the Wheatstone piezoresistive bri dge in advanced AFM investigations. We have utilized this cantilever i n investigations of the contact and noncontact modes, and in investiga tions of lateral forces and modulation load force microscopy. In the c ase of non-homogeneous surfaces, investigations of various surface par ameters and topography observations are very important. Such surfaces are used in most industrial applications, and investigations of their properties at the nanometre scale is of great interest.