As a result of work to establish the surface potential of insulators a
ccurately in a quadrupole static SIMS system of high sensitivity, we h
ave been able to study the effects of increasing dose-related damage o
n the intensities of the mass spectral peaks in the two archetypal bul
k polymers PET and PTFE, as well as thin hydrocarbon contamination lay
ers, with high accuracy. It is shown that the intensities follow very
well-defined functions which give damage cross-sections whose values r
eflect the fragmentation behaviour of the polymers. The effects reflec
t the number of bonds to be broken to liberate the fragment, the inter
nal complexity of that fragment and the typical damage zone of the ion
impact. These concepts show that a static SIMS limit of below 3 x 10(
15) ions m(-2) exists for changes of < 10% in the intensities of the m
ost easily damaged species but that some larger fragments may require
a dose of 2 x 10(17) ions m(-2) to maximize their intensity! This work
has three main conclusions. Firstly, by defining a figure of merit fa
ctor, F, equal to the ratio of the absolute intensity of a peak to the
fractional rate of change of that peak with the ion dose, it is possi
ble to define the optimal beam parameters for static SIMS measurements
. The higher the value of F, the more the intensity per unit of onset
of damage. The highest F values occur at higher beam energies and, in
general, xenon gives greater efficiency than argon. Secondly, the deve
lopment of damage may be described by simple bond breaking. Thirdly, a
study of tile damage process gives quite detailed structural bonding
information not directly available from the traditional static SIMS sp
ectrum.