CHARACTERIZATION OF TRIAZINE DERIVATIVES ON SILICON-WAFERS STUDIED BYPHOTOELECTRON-SPECTROSCOPY (XPS, UPS) AND METASTABLE IMPACT ELECTRON-SPECTROSCOPY (MIES)

Thin films of a diandicyanato bisphenol A (DCBA) prepolymer and thin l ayers of the trimer of the 2,4,6-tris-(p-cumylphenylcyanate)-1,3,5-tri azine (p-CPC trimer), both deposited on silicon wafers covered by thei r native oxide, have been investigated by X-ray photoelectron spectros copy (XPS), Ultraviolet photoelectron spectroscopy (UPS) and metastabl e impact electron spectroscopy (MIES). MIES as well as angle dependent XPS indicate a preferential orientation of the molecules of the first adlayer on the surface. The adsorption of the first layer is governed by the interaction of the trioxytriazine rings with the substrate sur face. This adsorption model is supported by the calculated conformatio n of the DCBA and p-CPC trimer.