THE USE OF PHASE-MATCHING AS THE NULL MET HOD FOR SCANNING BULK DEFORMATION FIELDS IN SEMICONDUCTOR-MATERIALS

Authors
MUSHER SL STUPAK MF SYSKIN VS
Citation
Sl. Musher et al., THE USE OF PHASE-MATCHING AS THE NULL MET HOD FOR SCANNING BULK DEFORMATION FIELDS IN SEMICONDUCTOR-MATERIALS, Kvantovaa elektronika, 23(8), 1996, pp. 762-764
Citations number
4
Categorie Soggetti
Physics, Applied","Engineering, Eletrical & Electronic
Journal title
Kvantovaa elektronika → ACNP
ISSN journal
03687147
Volume
23
Issue
8
Year of publication
1996
Pages
762 - 764
Database
ISI
SICI code
0368-7147(1996)23:8<762:TUOPAT>2.0.ZU;2-F
Abstract
A high polarisation sensitivity of the phase matching in nonlinear cry stals was utilised in fast scanning of bulk deformation fields in semi conductor substrates and films.