DI-CARBON DEFECTS IN ANNEALED HIGHLY CARBON-DOPED GAAS

Citation
J. Wagner et al., DI-CARBON DEFECTS IN ANNEALED HIGHLY CARBON-DOPED GAAS, Physical review letters, 78(1), 1997, pp. 74-77
Citations number
18
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
78
Issue
1
Year of publication
1997
Pages
74 - 77
Database
ISI
SICI code
0031-9007(1997)78:1<74:DDIAHC>2.0.ZU;2-O
Abstract
Formation of bonded dicarbon C-C centers is deduced from the observati on of Raman lines at 1742, 1708, and 1674 cm(-1) in GaAs codoped with C-12 and C-13 after annealing at 850 degrees C with concomitant loss o f vibrational scattering from C-As. The frequencies agree with results of ab initio theory for a C-C split interstitial (deep donor) formed by the trapping of a mobile interstitial C (displaced C-As) atom by an undisplaced C-As acceptor. Other mechanisms of carrier loss are infer red since a weaker Raman triplet is detected at 1859, 1824, and 1788 c m(-1) from a different C-C complex.