Tm speed of sound in a solid is altered in the presence of mechanical
stress. This effect can be exploited to form the basis of 'acoustic mi
croscopy', whereby images of stress patterns in a material are obtaine
d hy monitoring the times of flight of sound pulses'. The sensitivity
of this approach is limited because wave speeds typically change by le
ss than 1%, even when materials are stressed until they yield. Here we
demonstrate a more sensitive form of acoustic microscopy. In an isotr
opic elastic medium, stress-induced anisotropies affect wave polarizat
ions and phases, giving rise to interference between waves that would,
in the absence of stress, remain in phase; the resulting patterns of
interference between these waves reveal the underlying patterns of str
ess. This technique, by using acoustic waves of different wavelengths,
permits the imaging of stress in objects ranging in size from microel
ectric devices to welds in pressure vessels.