STRUCTURE DETERMINATION OF RH(100)-C(2X2)-S USING THE SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE TECHNIQUE

Authors
DHANAK VR HARTE SP SCAREL G COWIE BCC SANTONI A
Citation
Vr. Dhanak et al., STRUCTURE DETERMINATION OF RH(100)-C(2X2)-S USING THE SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE TECHNIQUE, Surface science, 366(3), 1996, pp. 765-768
Citations number
27
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
366
Issue
3
Year of publication
1996
Pages
765 - 768
Database
ISI
SICI code
0039-6028(1996)366:3<765:SDORUT>2.0.ZU;2-U
Abstract
The adsorption geometry of S in the c(2 x 2) structure on Rh(100) has been determined using surface extended X-ray absorption fine structure (SEXAFS. It is found that S adsorbs in the symmetrical four-fold holl ow site with an S-Rh bond length of 2.35 +/- 0.04 Angstrom. This geome try is consistent with S adsorption on the neighbouring (100) surfaces of Ni, Cu and Pd.