THE CONTROL OF STOICHIOMETRY IN EPITAXIAL SEMICONDUCTOR STRUCTURES - INTERFACIAL CHEMISTRY-PROPERTY RELATIONS

Authors
BACHMANN KJ
Citation
Kj. Bachmann, THE CONTROL OF STOICHIOMETRY IN EPITAXIAL SEMICONDUCTOR STRUCTURES - INTERFACIAL CHEMISTRY-PROPERTY RELATIONS, Materials science & engineering. B, Solid-state materials for advanced technology, 41(3), 1996, pp. 352-356
Citations number
NO
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Materials science & engineering. B, Solid-state materials for advanced technology → ACNP
ISSN journal
09215107
Volume
41
Issue
3
Year of publication
1996
Pages
352 - 356
Database
ISI
SICI code
0921-5107(1996)41:3<352:TCOSIE>2.0.ZU;2-J