DOUBLE INJECTION AND NEGATIVE-RESISTANCE IN STRIPE-GEOMETRY OXIDE-APERTURE ALYGA1-YAS-GAAS-INXGA1-XAS QUANTUM-WELL HETEROSTRUCTURE LASER-DIODES

Citation
Jj. Wierer et al., DOUBLE INJECTION AND NEGATIVE-RESISTANCE IN STRIPE-GEOMETRY OXIDE-APERTURE ALYGA1-YAS-GAAS-INXGA1-XAS QUANTUM-WELL HETEROSTRUCTURE LASER-DIODES, Applied physics letters, 69(19), 1996, pp. 2882-2884
Citations number
21
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
69
Issue
19
Year of publication
1996
Pages
2882 - 2884
Database
ISI
SICI code
0003-6951(1996)69:19<2882:DIANIS>2.0.ZU;2-K
Abstract
Data are presented demonstrating double injection and negative resista nce in stripe-geometry oxide-aperture AlyGa1-yAs-GaAs-InxGa1-xAs quant um well heterostructure lasers. The buried oxide laser structures are defined, in current and cavity, by laterally oxidizing the higher Al c omposition upper and lower cladding layers from a mesa edge (a ridge), thus, forming a narrow oxide-defined buried aperture (similar to 2 mu m). Post fabrication annealing (425 degrees C in N-2) removes the neg ative resistance, indicating that the crystal growth and oxidation pro cesses introduce products such as H and OH in the active region that c ompensate the dopants. (C) 1996 American Institute of Physics.