Data are presented demonstrating double injection and negative resista
nce in stripe-geometry oxide-aperture AlyGa1-yAs-GaAs-InxGa1-xAs quant
um well heterostructure lasers. The buried oxide laser structures are
defined, in current and cavity, by laterally oxidizing the higher Al c
omposition upper and lower cladding layers from a mesa edge (a ridge),
thus, forming a narrow oxide-defined buried aperture (similar to 2 mu
m). Post fabrication annealing (425 degrees C in N-2) removes the neg
ative resistance, indicating that the crystal growth and oxidation pro
cesses introduce products such as H and OH in the active region that c
ompensate the dopants. (C) 1996 American Institute of Physics.