H. Hongo et al., A 40-NM-PITCH DOUBLE-SLIT EXPERIMENT OF HOT-ELECTRONS IN A SEMICONDUCTOR UNDER A MAGNETIC-FIELD, Applied physics letters, 70(1), 1997, pp. 93-95
We report a double-slit experiment of hot electrons in a semiconductor
under a magnetic field, The pitch of the double slit buried in the se
miconductor is 40 nm and the electron energy is of the order of 100 me
V. By applying a magnetic field, the change in current that passes thr
ough the slits is observed at the segmented collector. The measured cu
rrent shows a clear minimum around B=0 T, with this behavior agreeing
with a theoretical calculation based on double-slit interference. Quan
titative estimation is consistent with this order of current variation
. We think that these results show evidence of the observation of hot
electron interference by a double slit in a semiconductor (C) 1997 Ame
rican Institute of Physics.