H. Pham et al., RELIABILITY AND MTTF PREDICTION OF K-OUT-OF-N COMPLEX-SYSTEMS WITH COMPONENTS SUBJECTED TO MULTIPLE STAGES OF DEGRADATION, International Journal of Systems Science, 27(10), 1996, pp. 995-1000
Citations number
10
Categorie Soggetti
System Science","Computer Science Theory & Methods","Operatione Research & Management Science
In some environments the components may not fail fully but can degrade
, and there may be multiple stages of degradation. In such cases, the
efficiency of the system may decrease. In this study we present a mode
l for predicting the reliability of k-out-of-n:G systems assuming that
components are subjected to several stages of degradation as well as
catastrophic failures. In the analysis we consider the state-dependent
transition rates far the catastrophic failures and degradation proces
ses. We also present the expressions to determine the reliability and
mean time to failure (MTTF) of the k-out-of-n systems. Reliability and
MTTF expressions for a special case of the model without catastrophic
failures are also presented. Several numerical examples are given to
illustrate the results.