A NEW VERSATILE ELECTRON-BEAM ION-TRAP

Authors
CURRELL FJ ASADA J ISHII K MINOH A MOTOHASHI K NAKAMURA N NISHIZAWA K OHTANI S OKAZAKI K SAKURAI M SHIRAISHI H TSURUBUCHI S WATANABE H
Citation
Fj. Currell et al., A NEW VERSATILE ELECTRON-BEAM ION-TRAP, Journal of the Physical Society of Japan, 65(10), 1996, pp. 3186-3192
Citations number
32
Categorie Soggetti
Physics
Journal title
Journal of the Physical Society of Japan → ACNP
ISSN journal
00319015
Volume
65
Issue
10
Year of publication
1996
Pages
3186 - 3192
Database
ISI
SICI code
0031-9015(1996)65:10<3186:ANVEI>2.0.ZU;2-9
Abstract
We have constructed an electron-beam ion trap (EBIT) to facilitate the creation and study of highly charged ions. After a brief introduction to EBITs in general, we describe the design of the new device, highli ghting its unique features. Some preliminary results are presented whi ch demonstrate the devices capability to produce and study highly char ged ions.