The second-order nonlinear optical coefficients d(33), d(31), and d(15
) of GaN:Mg epitaxial film were studied by the standard Maker fringe o
f an anisotropic medium. The measured d(33)=-(16.5+/-1.3) pm/V which i
s 55 times of the d(11) of quartz. The measured ratios of d(33)/d(31)
and d(31)/d(15) showed that the crystalline film is close to an ideal
wurzite structure. The refractive indices and the dispersive curves of
n(e), n(0) were also determined by TM and TE waveguide mode measureme
nts. (C) 1996 American Institute of Physics.