Ts. Jung et al., A 117-MM(2) 3.3-V ONLY 128-MB MULTILEVEL NAND FLASH MEMORY FOR MASS-STORAGE APPLICATIONS, IEEE journal of solid-state circuits, 31(11), 1996, pp. 1575-1583
For a quantum step in further cost reduction, the multilevel cell conc
ept has been combined with the NAND flash memory, Key requirements of
mass storage, low cost, and high serial access throughput have been ac
hieved by sacrificing fast random access performance. This paper descr
ibes a 128-Mb multilevel NAND flash memory storing 2 b per cell. Multi
level storage is achieved through tight cell threshold voltage distrib
ution of 0.4 V and is made practical by significantly reducing program
disturbance by using a local self-boosting scheme, An intelligent pag
e buffer enables cell-by-cell and state-by-state program and inhibit o
perations, A read throughput of 14.0 MB/s and a program throughput of
0.5 MB/s are achieved, The device has been fabricated with 0.4-mu m CM
OS technology, resulting in a 117 mm(2) die size and a 1.1 mu m(2) eff
ective cell size.