The alkali-metal/III-V semiconductor interface is a model system with
which to study overlayer metallization and Schottky barrier developmen
t. Until now, typically the cleaved (110) surfaces of the semiconducto
r have been utilized in this respect, though in this work we have used
the Ga-vacancy (2 x 2) reconstructed surface of GaAs(111)A as the sta
rting surface. This surface is known to exhibit many similarities with
the cleaved (110) surface, due to the separation of empty and filled
dangling bonds onto the Ga and As surface atoms respectively. We have
found through using soft X-ray photoemission from both core-level and
valence-band features that the interface is remarkably unreactive, wit
h almost no change in the Ga 3d lineshape with Na deposition at low te
mperatures. With regard to the growth-mode, work-function variation an
d band-bending however, the behaviour is close to that found for the c
leaved surface. The onset of the Na LVV Auger transition only occurs a
fter metallization begins and is consistent with ionic bonding to the
substrate, though the substrate core-level development points to a red
uced charge transfer with respect to the (110) surface.