N-type ZnSe thin films have been grown by MBE on GaAs (001) surfaces a
nd capped with an amorphous selenium layer. The Se cap was thermally d
esorbed under ultrahigh vacuum to recover the (2 x 1) and c(2 x 2) rec
onstructed surfaces, Selected metal contact formation was monitored us
ing core and valence level photoelectron emission spectroscopy by in-s
itu exposure of the surface to heated sources of Au, Ag and Pb. In eac
h case, lineshape analysis of emission spectra indicated a low level o
f interfacial mixing and provided an insight into the metal layer grow
th mode, Both Au and Ag were found to grow in closely spaced islands o
f approximately equal height. The morphology of Au and Ag layers was c
onfirmed by cross-sectional transmission electron microscopy. Monitori
ng of core and valence level emission peak positions allowed the deter
mination of the metal-n-ZnSe Schottky barrier height, for a sufficient
ly thick metallic layer. Measurements on this wide-gap semiconductor,
even at 300 K, were influenced by the presence of a surface photovolta
ge, which could be identified and subtracted for a fully-formed metall
ic layer. The n-type ZnSe Schottky barrier heights inferred from the r
elative Fermi level shifts (Phi(BN)(Au) = 1.74 eV, Phi(BN)(Ag) = 1.47
eV and Phi(BN)(Pb) = 1.25 eV), were found to scale with the metal work
function for these three unreactive interfaces.