F. Klinkhammer et al., INTERFACE ROUGHNESS IN FE(100) CR FILM STRUCTURES STUDIED BY CEMS/, Journal of magnetism and magnetic materials, 161, 1996, pp. 49-56
Various epitaxial Fe(100)/Cr film structures were MBE-grown on MgO(100
) and GaAs(100) substrates with the aim to modify the roughness of the
Fe/Cr interfaces. By introducing a 2 monolayer thick Fe-57 probe laye
r at the interface the distribution of the magnetic hyperfine (hf) fie
lds could be measured locally by means of Fe-57 conversion electron Mo
ssbauer spectroscopy (GEMS). A simple model is applied which allows th
e determination of a pattern of the average interface roughness from t
his hf field distribution. It was observed that even samples of high e
pitaxial quality according to LEED and RHEED reveal a micro-roughness
on a lateral scale of 1-2 nm due to intermixing of Fe and Cr within 1-
2 monolayers.