X-RAY PHOTOELECTRON FORWARD SCATTERING AND SINGLE SCATTERING CLUSTER CALCULATIONS FOR V2O5(001)

Citation
K. Devriendt et al., X-RAY PHOTOELECTRON FORWARD SCATTERING AND SINGLE SCATTERING CLUSTER CALCULATIONS FOR V2O5(001), Solid state communications, 100(7), 1996, pp. 481-485
Citations number
3
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
100
Issue
7
Year of publication
1996
Pages
481 - 485
Database
ISI
SICI code
0038-1098(1996)100:7<481:XPFSAS>2.0.ZU;2-3
Abstract
Single scattering cluster calculations were performed for the V2p(3/2) photoelectron peak of a V2O5 (001) surface. They were compared with t he experimental diffraction pattern and with an X-ray Photoelectron Fo rward Scattering interpretation. The SSC calculations provide an exten sion of the FS approach by taking into account the contribution of int erference peaks, which led to a refined structural determination. A de viation between the experimental and theoretical pattern was revealed and an adjusted surface structure was suggested, based on SSC modellin g. Copyright (C) 1996 Elsevier Science Ltd