I. Iga et al., CROSS-SECTIONS FOR THE FORMATION OF S- IONS BY ELECTRON-IMPACT ON OCS, International journal of mass spectrometry and ion processes, 155(1-2), 1996, pp. 99-105
Citations number
17
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
Cross-sections, appearance energies and peak energies at which S- ion
intensities are maximal have been measured for electron attachment to
OCS as a function of electron impact energy in the energy range 0-20 e
V using a time-of-flight mass spectrometer in a crossed-beams collisio
n geometry. Maximum intensities of formation of S - were observed at f
our electron impact energies of 1.4, 4.7, 7.0, and 10.2 eV with an acc
uracy to +/-0.25 eV. The cross-sections measured at these energies wer
e 2.6 x 10(-17), 1.5 x 10(-19), 1.8 x 10(-19), and 0.4 x 10(-19) cm(2)
respectively, with an uncertainty of about +/-15%. From appearance en
ergies of various resonance processes for S- formation and by using th
ermochemical data we have been able to identify various dissociative e
lectron attachment channels of OCS. Cross-section values for three add
itional dissociative channels for the formation of S- and time-of-flig
ht spectra representing the kinetic energies of these ions are reporte
d for the first time.